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Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials by C. H. Chen - Paperback
713.34 AED

Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials by C. H. Chen - Paperback

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Category Type
Information Technology
ISBN
9783642834240
Author
C. H. Chen
Publisher
Springer
Description:

The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been playing an increasingly important role in improving nondestructive evaluation and testing ...

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PRODUCT INFORMATION

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    Specifications

    Category Type
    Information Technology
    ISBN
    9783642834240
    Languages
    English
    Item EAN
    2724437275913
    People
    Author
    C. H. Chen
    Category Type
    Information Technology
    ISBN
    9783642834240
    Languages
    English
    Item EAN
    2724437275913
    People
    Author
    C. H. Chen
    People
    Publisher
    Springer
    Technical Information
    Binding
    Paperback
    Languages and countries
    Book Language
    English
    Read more
  •  

    Description:

    The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been

    The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been playing an increasingly important role in improving nondestructive evaluation and testing techniques. The cross fertilization of the two major areas can lead to major advances in NOE as well as presenting a new research area in signal processing. With this in mind, the Workshop provided a good review of progress and comparison of potential techniques, as well as constructive discussions and suggestions for effective use of modern signal processing to improve flaw detection, classification and prediction, as well as material characterization. This Proceedings volume includes most presentations given at the Workshop. This publication, like the meeting itself, is unique in the sense that it provides extensive interactions among the interrelated areas of NOE. The book starts with research advances on inverse problems and then covers different aspects of digital waveform processing in NOE and eddy current signal analysis. These are followed by four papers of pattern recognition and AI in NOE, and five papers of image processing and reconstruction in NOE. The last two papers deal with parameter estimation problems. Though the list of papers is not extensive, as the field of NOE signal processing is very new, the book has an excellent collection of both tutorial and research papers in this exciting new field.

    Product Features:
    • Category: Information Technology
    • Binding: Paperback
    • Language of Text: English
    • Author(s): C. H. Chen
    • Publisher: Springer
    • ISBN: 9783642834240
    • Number of Pages: 344
    • Dimensions: 9.5 x 6.6 x 0.9 inches
 

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